第1年
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The 646 Double Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDX analysis of crystalline TEM specimens.
主要特点：
Key Features
Low background design
Beryllium specimen cradle, Hexring® and Anti-twist washer to gently and securely hold the specimen in place
ToggleTilt™ beta drive mechanism
Robust operation with no mechanical binding of the specimen cradle at tilt limits
Maximum +/- 30° using TEM control
Maximum +/- 45° using Accutroller
Reduced Shadowing
Optimized for EDX analysis
Integral Faraday Cage
Quantitative measurement of the incident electron current
Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories. Please contact your local Gatan representative for more information.
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