MiniCL-阴极荧光谱仪

MiniCL
Cathodoluminescence imaging in the SEM (or microprobe) can be used to locate and characterise impurities, defects, grain boundaries, zonation and overgrowths in a wide range of materials.

MiniCL is a simple but effective CL imaging system which can be attached to any SEM and many Microprobes. The novel design utilizes a minature, highly sensitive PMT mounted inside the SEM chamber at the end of a retractable probe. 185-850nm.


MiniCL with simple desk top controller.


The MiniCL is manufactured and configured for a chosen port on the SEM or microprobe, this can be horizontal or inclined. The imaging signal is an analogue voltage which requires a free scan synchronous auxiliary analogue input on the microscope or beam control frame store. The imaging performance is therefore dependent on the flexibility of the scan generator and frame store. For low luminescent specimens, slow scanning is required. For best result Gatan’s DigiScan II digital beam control system is recommended.

MiniCL provides sensitive panchromatic CL imaging in the UV and visible over a very wide field of view, and is suitable for working at even the lowest SEM magnifications.

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