BF/DF STEM Detector-明暗场像探头

EELS加STEM附件-Gatan 805 BF/DF明暗场像探头、806 HAADF高角暗场像探头，以及扫描控制器DigiScan II;EDS型号采集整合系统。
EELS配合STEM可以获得空间分辨率为次纳米级的元素成分分析。GIF或Enfina在基本配置的基础上，增加Gatan STEMPack的成像系统包，获得同轴安装的Gatan 805明暗场像探头，也可同时配备Gatanzei新的806高角暗场像探头，和DigiScan II STEM扫描控制和信号获取控制器，就可获得基于EELS的二维图像。再搭配Gatan的EDS信号获取模块，使得用户可以同时获得EELS,EDS,BF/DF以及HAADF信号，这种整合系统是市场上唯一的组合，就在Gatan! 
Scanning transmission electron microscopy (STEM) imaging can provide structural and compositional information over nanometer and sub-nanometer scales. The Gatan 805 BF/DF STEM detector can be used in bright field (BF) or dark field (DF) modes. Advantages of the detector include ultra-low noise performance, high sensitivity and on-axis installation allowing simultaneous DF imaging and electron energy-loss spectroscopy (EELS).

Specifications

The detector position (BF, DF or fully retracted) is pneumatically controlled. The detector position is aligned to be the optic axis of GIF or Enfina and is ideal for spectrum imaging and manual EELS experiments.

The electron signal is converted to light using a thick YAG scintillator that operates up to 400kV. The light signal is coupled using a light pipe to a photomultiplier tube (PMT). The PMT and preamplifier are contained in a shield that minimizes the effect of electromagnetic interference. The response of system is linear over standard STEM operating conditions. The bandwidth of the preamplifier can be optimized for pulse counting.

The 805 BF/DF STEM detector is the ideal partner to any GIF or Enfina system.

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