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赛默飞HELIX SFT稀有气体质谱仪 特
超高分辨率质谱检测-赛默飞Orbitrap
赛默飞VQDUO-TANDEM Vanquish™ Du
赛默飞Dionex™ ICS- VWD 可变波长
Vanquish P 系列电雾式检测器
赛默飞Dionex™ ICS-4000 CD 电导检
赛默飞253 Plus 10 kV 同位素比 MS
赛默飞11206180EA IsoLink™ IRMS
Dionex™ CRD 180, 200 and 300 Car
- 产地：
- 美国
- 型号：
- IQLAAEGAAMFABWMAFA
Thermo Scientific™
Element GD Plus™ GD-MS货号: IQLAAEGAAMFABWMAFA
Redefine the analysis of advanced high purity materials directly in solid state with the Thermo Scientific™ Element GD Plus™ GD-MS. For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.
The Element GD Plus GD-MS enables analysis of nearly all elements in the periodic table from both conductive and non-conductive materials with the same level of sensitivity and data quality. Analysis of low melting point metals such as gallium are made easy with a dedicated workflow for sample preparation and analysis. This makes GD-MS the reliable standard for any metal analysis.
类型 | GS 质谱仪 |
| 动态范围 | >1012 线性，带有自动交叉校准功能 |
| 质量分辨率 | 3种固定分辨率：≥300、≥ 4,000、≥ 10,000 |
| 质量稳定性 | 25 ppm/8 小时 |
| 电源 | 3 相，230/400 V ± 10%，50/60 Hz 熔融 32 A/相 |
| 灵敏度 | 对于中分辨率条件下铜峰，>1 x 1010 Cps (1.6 x 10-9 A)（峰高，总离子流） |
| Unit Size | Each |
辉光Element GD Plus™ GD-MS由赛默飞色谱与质谱分析 为您提供，如您想了解更多关于辉光Element GD Plus™ GD-MS报价、参数等信息 ，欢迎来电或留言咨询。
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