帕纳科锐影射线衍射仪EmpyreanX
马尔文微量热等温滴定量热仪MicroCa
帕纳科矿业专业版射线荧光光谱仪Zet
全自动头电加热熔融制样机Claisse T
马尔文在线电位测量仪zetaZetasizer
马尔文高灵敏纳米粒度分析仪Zetasiz
帕纳科卓越分析至尊版射线荧光光谱
Morphologi 4 全自动静态图像分析系
马尔文Zetasizer Nano ZSE
马尔文微量热等温滴定量热仪MicroCa
- 型号：
- Semyos
- 产地：
- 其他国家
PANalytical's Semyos energy-dispersive XRF wafer analyzer is the latest of our successful process control tools designed specifically for semiconductor and data storage metrology. This versatile instrument determines layer composition and thickness uniformity for a wide range of process films.
Moreover, with its<23um FWHM microspot, it is able to measure in the scribelines or in dedicated metrology areas on production wafers.
The Semos wafer analyzer is an advanced metrology tool that addresses the following industry demands:
* On-product thin film metrology
* In-line process control
* Simultaneous determination of film thinkness and composition
* Ability to characterize single films and multi-layer stacks
* Excellent repeatability and reproducibility (Gauge R&R)
* Minimal COO through excellent uptime, high throughput and minimum consumption of utilities
主要特点：
Semyos: Addressing the needs of the semiconductor and data storage industry.
Microspot XRF analysis on production wafers
Versatile wafer handling
For in-line production XRF analysis
Designed for ease-of-use
注：该仪器未取得中华人民共和国医疗器械注册证，不可用于临床诊断或治疗等相关用途
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